Metrology & Analysis Systems

These include instruments used for thickness measurement, optics characterization, spectrophotometry, photoluminescence, optical monitoring, fluorescence lifetime analysis, angular light distribution, beam characterization and more.

Product	Wavelength Accuracy	Wavelength Reproducibility	Wavelength Resolution	Availability	Price (USD)
Spectrophotometer	1 nm	±0.5 nm	2 nm	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 1 nm Wavelength Reproducibility ±0.5 nm Wavelength Resolution 2 nm Wavelength Range 2700 - 5200 nm Detection Wavelength Region Short-Wave IR Mid IR Dimensions 1060 x 410 x 420 mm Spot Size on Sample 6 x 5.5 mm Weight 68.95 kg (152 lbs) Light Source IR Lamp Wavelength Sampling Pitch 0.5 - 100 nm Scattered Light Level 0.2% Photometric Functions %T Supply Voltage 110 - 220 V (50/60 Hz) Lens Diameter 10 mm (Minimum) 200 mm (Maximum) Focal Length 20 mm - ∞ ∞ mm Lens Focal Length 20 mm - ∞ ∞ mm Monochromator Czerny-Turner Reference Channel Yes Baseline Stability ±0.3% (per hour) Optics Mirror: Al + MgF 2 , Lenses: CaF 2 Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	3.6 nm	±0.9 nm	8 nm (Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 3.6 nm Wavelength Reproducibility ±0.9 nm Wavelength Resolution 8 nm (Non-Polarized Light) Wavelength Range 7500 - 14000 nm Detection Wavelength Region Mid IR, Long-Wave IR Dimensions 760 x 340 x 370 mm Spot Size on Sample 6 x 3 mm Weight 50.8 kg (112 lbs) Light Source HgAr Wavelength Calibration Verification Lamp IR Lamp Wavelength Sampling Pitch 0.5 - 100 nm Photometric Functions %R, %T Supply Voltage 110 - 220 V (50/60 Hz) Maximum Sample Size 150 x 200 mm Key Features Synchronized Computer Controlled Positioning Polarization Measurement (S + P) / 2 P-Pol. S-Pol. Beam Displacement Compensation 40 mm Maximum Sample Thickness 40 mm Photometric Accuracy 47% (±0.2%, λ, 0m, 10600 nm) Photometric Reproducability ±0.1% Baseline Stability ±0.3% (per hour) Optics Mirror: Au, Lenses: ZnSe + AR Transmittance Measurement Variable angle measurements: 0 - 60 deg angles of incidence Monochromator Czerny-Turner Reflectance Measurement Interchangeable sample stages with fixed angles of incidence: 10, 30, 45 and 60 deg Reference sample: gold mirror Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	±0.02 nm, ±0.04 nm	±0.01 nm, ±0.02 nm	0.06 nm, 0.13 nm	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 250 W Wavelength Accuracy ±0.02 nm, ±0.04 nm Wavelength Reproducibility ±0.01 nm, ±0.02 nm Wavelength Resolution 0.06 nm, 0.13 nm Wavelength Range 340 - 2000 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR Dimensions 20828 x 13843 x 9144 mm (820 x 545 x 360") Spot Size on Sample 4 x 3 mm Weight 54.88 kg (121 lbs) Wavelength Sampling Pitch 0.01 - 100 nm Scattered Light Level < 1e-06%, 1%, 1e-05% (532 nm) Photometric Functions %T Supply Voltage 110 - 220 V (50/60 Hz) Maximum Sample Size < 55 x 90 x 120 mm < 152.4 mm (Closed Lid for Standard Sample Stage) Monochromator Czerny-Turner Reference Channel Yes Baseline Stability < 0.2% (per hour) Optics Mirror, protected Ag Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 1700 nm)	0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 1700 nm)	0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 1700 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 1700 nm) Wavelength Reproducibility 0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 1700 nm) Wavelength Resolution 0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 1700 nm, Non-Polarized Light) Wavelength Range 380 - 1700 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm)	0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm)	0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 3500 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm) Wavelength Reproducibility 0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm) Wavelength Resolution 0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 3500 nm, Non-Polarized Light) Wavelength Range 185 - 3500 nm Detection Wavelength Region UV, Short-Wave IR, DUV, Visible, Near IR, Mid IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Deuterium Lamp Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.5 nm	±0.25 nm	2 nm (at 185 - 990 nm) 4 nm (at 990 - 1700 nm)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.5 nm Wavelength Reproducibility ±0.25 nm Wavelength Resolution 2 nm (at 185 - 990 nm) 4 nm (at 990 - 1700 nm) Wavelength Range 380 - 1700 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR Dimensions 680 x 440 x 360 mm Spot Size on Sample 6 x 5.5 mm (Transmittance) 1 x 1 mm (Reflectance) Weight 49.9 kg (110 lbs) Light Source Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.5 - 100 nm Scattered Light Level < 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50/60 Hz) Angle of Incidence 12° (Reflectance) Lens Diameter 10 - 150 mm (Transmittance) 10 - 90 mm (Self-Centering Lens Mount, Reflectance) 10 - 115 mm (Customized Lens Holder, Reflectance) Monochromator Czerny-Turner Reflectance Measurement Lens radius: ∞ ... - 15 mm .../+ 15 mm ... ∞ Reference Channel Yes Baseline Stability < 0.1% (per hour, UV-VIS) Optics Mirror, Al + SiO2, Al + MgF2 Transmittance Measurement Focal length of the measured sample: ∞ ... - 20 mm/+ 20 mm ... ∞ Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm)	0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm)	0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 3500 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm) Wavelength Reproducibility 0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 3500 nm) Wavelength Resolution 0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 3500 nm, Non-Polarized Light) Wavelength Range 380 - 3500 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR, Mid IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm)	0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm)	0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 5200 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm) Wavelength Reproducibility 0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm) Wavelength Resolution 0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 5200 nm, Non-Polarized Light) Wavelength Range 185 - 5200 nm Detection Wavelength Region UV, Short-Wave IR, DUV, Visible, Near IR, Mid IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Deuterium Lamp Halogen Lamp HgAr Wavelength Calibration Verification Lamp IR Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.5 nm	±0.25 nm	2 nm (at 185 - 990 nm) 4 nm (at 990 - 1700 nm)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.5 nm Wavelength Reproducibility ±0.25 nm Wavelength Resolution 2 nm (at 185 - 990 nm) 4 nm (at 990 - 1700 nm) Wavelength Range 185 - 1700 nm Detection Wavelength Region UV, Short-Wave IR, DUV, Visible, Near IR Dimensions 680 x 440 x 360 mm Spot Size on Sample 6 x 5.5 mm (Transmittance) 1 x 1 mm (Reflectance) Weight 49.9 kg (110 lbs) Light Source Deuterium Lamp Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.5 - 100 nm Scattered Light Level < 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50/60 Hz) Angle of Incidence 12° (Reflectance) Lens Diameter 10 - 150 mm (Transmittance) 10 - 90 mm (Self-Centering Lens Mount, Reflectance) 10 - 115 mm (Customized Lens Holder, Reflectance) Monochromator Czerny-Turner Reflectance Measurement Lens radius: ∞ ... - 15 mm .../+ 15 mm ... ∞ Reference Channel Yes Baseline Stability < 0.1% (per hour, UV-VIS) Optics Mirror, Al + SiO2, Al + MgF2 Transmittance Measurement Focal length of the measured sample: ∞ ... - 20 mm/+ 20 mm ... ∞ Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 1700 nm)	0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 1700 nm)	0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 1700 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.25 nm (at 185 - 350 nm) 0.5 nm (at 350 - 990 nm) 1 nm (at 990 - 1700 nm) Wavelength Reproducibility 0.125 nm (at 185 - 350 nm) 0.25 nm (at 350 - 990 nm) 0.5 nm (at 990 - 1700 nm) Wavelength Resolution 0.3 nm (at 185 - 350 nm, Non-Polarized Light) 0.6 nm (at 350 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 1700 nm, Non-Polarized Light) Wavelength Range 185 - 1700 nm Detection Wavelength Region UV, Short-Wave IR, DUV, Visible, Near IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Deuterium Lamp Halogen Lamp HgAr Wavelength Calibration Verification Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics
Spectrophotometer	0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm)	0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm)	0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 5200 nm, Non-Polarized Light)	Contact Supplier	Add to cart to request quote
Product Code Power Consumption 110 W Wavelength Accuracy 0.5 nm (at 380 - 990 nm) 1 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm) Wavelength Reproducibility 0.25 nm (at 380 - 990 nm) 0.5 nm (at 990 - 2450 nm) 2 nm (at 2450 - 5200 nm) Wavelength Resolution 0.6 nm (at 380 - 990 nm, Non-Polarized Light) 1.2 nm (at 990 - 2450 nm, Non-Polarized Light) 2.4 nm (at 2450 - 5200 nm, Non-Polarized Light) Wavelength Range 380 - 5200 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR, Mid IR Dimensions 425 x 625 x 285 mm Spot Size on Sample 6 x 2 mm Weight 50 kg Light Source Halogen Lamp HgAr Wavelength Calibration Verification Lamp IR Lamp Wavelength Sampling Pitch 0.1 - 100 nm Scattered Light Level 0.1% (532 nm) Photometric Functions %R, %T Supply Voltage 110 - 220 V (50 - 60 Hz) Maximum Sample Size < 152.4 mm (6", Closed Lid for Standard Sample Stage) < 140 mm (5.5", Closed Lid for Z Sample Stage) Angle of Incidence 0 - 75° (Transmittance, up to 85 deg with 7085 sample stage) 8 - 75° (Reflectance, up to 85 deg with 7085 sample stage) Key Features Independent Computer Controlled Positioning of Sample Stage and Photodetectors Unit Polarization Measurement (S + P) / 2 P-Pol. Random S-Pol. Beam Displacement Compensation -60 to 60 mm Options Motorized And Non-Motorized Sample Stages Reference Channel Yes Baseline Stability 0.1% (per hour) Optics Mirror, MgF2 Monochromator Czerny-Turner Turning Pitch Angle of Sample Stage 0.01° Interface USB Supplier Location Lithuania See product details More from EssentOptics