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Product	Wavelength Range	Detection Wavelength Region	Applications	Availability	Price (USD)
Third-Order Autocorrelator	800 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 800 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 2 fs Pulse Energy Range 250 μJ - 1 mJ Repetition Rate < 50 kHz Delay Scan Range 633 ps Dynamic Range < 140 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
X-Ray / XUV Spectrometer	5 - 80 nm	DUV, X-Ray	Characterization of XUV/Soft X-Ra...	Contact Supplier	Add to cart to request quote
Product Code Wavelength Range 5 - 80 nm Applications Characterization of XUV/Soft X-Ray Radiation Key Features Adapters for Different Geometry Options Filter Insertion Unit Flat-Field Grazing-Incidence Integrated Gate Valve Operation with and without Entrance Slit User-Friendly Alignment Detection Wavelength Region DUV, X-Ray Spectral Resolution 0.02 - 0.1 nm Photon Energy Range 15 - 248 eV Operation Mode Entrance slit or slit-less Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	800 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 370 mm (Footprint) Wavelength Range 800 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 1.9 ns Dynamic Range 110 dB Measurable Pulse Width 6 - 10 fs Time Zero Position User-selectable on-site Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	1030 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 1030 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 3.8 ns Dynamic Range 110 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	800 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 800 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 2 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 633 ps Dynamic Range 120 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
White Light Interferometer	900 - 2400 nm	Short-Wave IR Near IR	Characterization of Group Delay D...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 450 x 450 mm (Footprint) Wavelength Range 900 - 2400 nm Applications Characterization of Group Delay Dispersion of Mirrors Key Features Broad Spectral Range No Need For Reference Lasers No Requirements on Specific Reflectivity Software Included Detection Wavelength Region Short-Wave IR Near IR Input Polarization S and P Angle of Incidence 5 - 70° (and 0°) Spectral Resolution 4 nm (Accuracy) GDD Accuracy ±5 fs² Optics Size 1 inch (other sizes upon request) Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	1030 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 1030 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 250 μJ - 1 mJ Repetition Rate < 50 kHz Delay Scan Range 3.8 ns Dynamic Range < 140 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	800 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 370 mm (Footprint) Wavelength Range 800 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 3.8 ns Dynamic Range 110 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	1030 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 1030 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 1.9 ns Dynamic Range 110 dB Measurable Pulse Width 6 - 10 fs Time Zero Position User-selectable on-site Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	1030 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 370 mm (Footprint) Wavelength Range 1030 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 4 fs Pulse Energy Range 50 - 150 μJ Repetition Rate < 50 kHz Delay Scan Range 1.9 ns Dynamic Range 100 dB Measurable Pulse Width 6 - 10 fs Time Zero Position User-selectable on-site Supplier Location Germany See product details More from UltraFast Innovations
Third-Order Autocorrelator	1030 nm	Near IR	Characterization of High...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 540 x 520 mm (Footprint) Wavelength Range 1030 nm Applications Characterization of High-Intensity Laser Contrast Laser Pulse Contrast Measurement Key Features No Ghost Pulse Artefacts Sensitive Pulse Contrast Measurement User-Friendly Software Package Detection Wavelength Region Near IR Input Polarization Vertical Delay Resolution 2 fs Pulse Energy Range 250 μJ - 1 mJ Repetition Rate < 50 kHz Delay Scan Range 633 ps Dynamic Range < 140 dB Measurable Pulse Width 6 - 10 fs Time Zero Position Customizable Supplier Location Germany See product details More from UltraFast Innovations
Cavity-Ringdown Reflectometer	375 - 1550 nm	UV, Short-Wave IR, Visible, Near IR	Characterisation of High...	Contact Supplier	Add to cart to request quote
Product Code Wavelength Range 375 - 1550 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR Applications Characterisation of High-Reflective optics Characterisation of Laser optics Characterisation of low-losses optics Dimensions 900 x 450 mm (Footprint) 900 x 550 mm (for More than 1 Wavelength, Footprint) Key Features Computer and User-friendly Software Interface Included Input Polarization S and P Angle of Incidence 5 - 45° 0° Light Source Diode Laser Options Possibility to Add More Wavelengths Later (Requires factory upgrade. A bigger footprint should be considered in advance) Reflectance Measurement Reflectivity down to 0.0005% (5 ppm) (Antireflective Coating Characterization), Reflectivities up to 99.9995% Number of Wavelengths 3 (Maximum) 1 Optics Size 0.5", 1" (2" and more upon request) Supplier Location Germany See product details More from UltraFast Innovations
White Light Interferometer	250 - 1060 nm	UV, Visible, Near IR	Characterization of Group Delay D...	Contact Supplier	Add to cart to request quote
Product Code Dimensions 450 x 450 mm (Footprint) Wavelength Range 250 - 1060 nm Applications Characterization of Group Delay Dispersion of Mirrors Key Features Broad Spectral Range No Need For Reference Lasers No Requirements on Specific Reflectivity Software Included Detection Wavelength Region UV, Visible, Near IR Input Polarization S and P Angle of Incidence 5 - 70° (and 0°) Spectral Resolution 1 nm (Accuracy) GDD Accuracy ±5 fs² Optics Size 1 inch (other sizes upon request) Supplier Location Germany See product details More from UltraFast Innovations
Carrier-Envelope-Phase (CEP) Meter	500 - 1000 nm	Visible, Near IR	Attosecond Metrology	Contact Supplier	Add to cart to request quote
Product Code Wavelength Range 500 - 1000 nm Detection Wavelength Region Visible, Near IR Applications Attosecond Metrology Dimensions 350 x 300 mm (Footprint) Input Polarization P-Polarized Pulse Energy Range 10 - 40 μJ 30 μJ (Best Performance) Repetition Rate 10 kHz Pulse Duration < 4.5 fs (750 nm) Phase Resolution (Angle) > 200 mrad Supplier Location Germany See product details More from UltraFast Innovations
Cavity-Ringdown Reflectometer	450 - 2000 nm (Freely Selected)	Short-Wave IR Visible Near IR	Characterisation of High...	Contact Supplier	Add to cart to request quote
Product Code Wavelength Range 450 - 2000 nm (Freely Selected) Detection Wavelength Region Short-Wave IR Visible Near IR Applications Characterisation of High-Reflective optics Characterisation of Laser optics Characterisation of low-losses optics Dimensions 900 x 550 mm (Footprint) Key Features Computer and User-friendly Software Interface Included Input Polarization S and P Angle of Incidence 5 - 45° 0° Light Source Supercontinuum with Monochromator Options Possibility to Add More Wavelengths Later Reflectance Measurement Reflectivity down to 0.0005% (5 ppm) (Antireflective Coating Characterization), Reflectivities up to 99.9995% Number of Wavelengths 3 (Maximum is Unlimited) Optics Size 0.5", 1" (2" and more upon request) Supplier Location Germany See product details More from UltraFast Innovations
Cavity-Ringdown Reflectometer	355 nm, 532 nm, 1064 nm 375 - 1550 nm	UV, Short-Wave IR, Visible, Near IR	Characterisation of High...	Contact Supplier	Add to cart to request quote
Product Code Wavelength Range 355 nm, 532 nm, 1064 nm 375 - 1550 nm Detection Wavelength Region UV, Short-Wave IR, Visible, Near IR Applications Characterisation of High-Reflective optics Characterisation of Laser optics Characterisation of low-losses optics Dimensions 900 x 550 mm (Footprint) Key Features Computer and User-friendly Software Interface Included Input Polarization S and P Angle of Incidence 5 - 45° 0° Light Source Microchip Laser Options Possibility to Add More Wavelengths Later (Requires factory upgrade) Reflectance Measurement Reflectivity down to 0.0005% (5 ppm) (Antireflective Coating Characterization), Reflectivities up to 99.9995% Number of Wavelengths 4 (Maximum) 3 Optics Size 0.5", 1" (2" and more upon request) Supplier Location Germany See product details More from UltraFast Innovations